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[IEEE 2010 2nd International Workshop on Intelligent Systems and Applications (ISA) - Wuhan, China (2010.05.22-2010.05.23)] 2010 2nd International Workshop on Intelligent Systems and Applications - Novel Method for Single-Trial Estimation of Event-Related Potential

✍ Scribed by Lv, MeiLei; Zhu, Yonghua; Yu, Shiming

Book ID: 118058983
Publisher: IEEE
Year: 2010
Weight: 225 KB
Volume: 0
Category: Article
ISBN: 1424458722
DOI: 10.1109/iwisa.2010.5473773

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