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[IEEE 2010 2nd International Conference on Industrial and Information Systems (IIS 2010) - Dalian, China (2010.07.10-2010.07.11)] 2010 2nd International Conference on Industrial and Information Systems - Analysis of critical success factors in IT project management

✍ Scribed by Daojin Fan,

Book ID: 120186573
Publisher: IEEE
Year: 2010
Weight: 120 KB
Category: Article
ISBN: 142447860X
DOI: 10.1109/INDUSIS.2010.5565760

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