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[IEEE 2010 2nd International Conference on Computer Engineering and Technology - Chengdu, China (2010.04.16-2010.04.18)] 2010 2nd International Conference on Computer Engineering and Technology - An improved reliability model based on software architecture

✍ Scribed by Chang Liu, ; Jun Zheng, ; Zhanyong Ren,

Book ID: 126317047
Publisher: IEEE
Year: 2010
Weight: 231 KB
Category: Article
ISBN: 1424463475
DOI: 10.1109/ICCET.2010.5485260

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