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[IEEE 2010 2nd International Conference on Computer Engineering and Technology - Chengdu, China (2010.04.16-2010.04.18)] 2010 2nd International Conference on Computer Engineering and Technology - Comparison for the accuracy of defect fix effort estimation

✍ Scribed by Thaw, Tinzar; Myintzu Phyo Aung, ; Naw Lay Wah, ; Swe Swe Nyein, ; Zar Lwin Phyo, ; Khaing Zarchi Htun,

Book ID: 118254669
Publisher: IEEE
Year: 2010
Weight: 298 KB
Volume: 0
Category: Article
ISBN: 1424463475
DOI: 10.1109/iccet.2010.5485813

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