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[IEEE 2010 23rd International Conference on VLSI Design: concurrently with the 9th International Conference on Embedded Systems Design (VLSID) - Bangalore, India (2010.01.3-2010.01.7)] 2010 23rd International Conference on VLSI Design - Parametric Fault Diagnosis of Nonlinear Analog Circuits Using Polynomial Coefficients

✍ Scribed by Sindia, Suraj; Singh, Virendra; Agrawal, Vishwani D.

Book ID: 118231399
Publisher: IEEE
Year: 2010
Weight: 206 KB
Volume: 0
Category: Article
ISBN: 1424455413
DOI: 10.1109/vlsi.design.2010.81

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