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[IEEE 2010 21st IEEE International Symposium on Rapid System Prototyping (RSP) - Fairfax, VA, USA (2010.06.8-2010.06.11)] Proceedings of 2010 21st IEEE International Symposium on Rapid System Protyping - Failure mode and effect analysis based on electric and electronic architectures of vehicles to support the safety lifecycle ISO/DIS 26262

✍ Scribed by Hillenbrand, M.; Heinz, M.; Adler, N.; Matheis, Johannes; Muller-Glaser, K. D.

Book ID: 121846795
Publisher: IEEE
Year: 2010
Weight: 683 KB
Category: Article
ISBN: 1424470730
DOI: 10.1109/RSP.2010.5656351

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