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[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Image Quality Metrics: PSNR vs. SSIM

โœ Scribed by Hore, Alain; Ziou, Djemel


Book ID
120239854
Publisher
IEEE
Year
2010
Tongue
English
Weight
646 KB
Category
Article
ISBN
1424475422

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โœฆ Synopsis


In this paper, we analyse two well-known objective image quality metrics, the peak-signal-to-noise ratio (PSNR) as well as the structural similarity index measure (SSIM), and we derive a simple mathematical relationship between them which works for various kinds of image degradations such as Gaussian blur, additive Gaussian white noise, jpeg and jpeg2000 compression. A series of tests realized on images extracted from the Kodak database gives a better understanding of the similarity and difference between the SSIM and the PSNR.


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