✦ LIBER ✦
[IEEE 2010 18th International Conference on Advanced Thermal Processing of Semiconductors (RTP) - Gainesville, FL, USA (2010.09.28-2010.10.1)] 2010 18th International Conference on Advanced Thermal Processing of Semiconductors (RTP) - Investigation of the temperature coefficient of electrical resistance and 1/f noise of laser-annealed amorphous silicon layers
✍ Scribed by Foerster, J.; Vogt, H.; Grabmaier, A.
- Book ID
- 121649816
- Publisher
- IEEE
- Year
- 2010
- Weight
- 712 KB
- Category
- Article
- ISBN
- 1424484006
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