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[IEEE 2010 17th IEEE International Conference on Image Processing (ICIP 2010) - Hong Kong, Hong Kong (2010.09.26-2010.09.29)] 2010 IEEE International Conference on Image Processing - Effective sinogram-inpainting for metal artifacts reduction in X-ray CT images

✍ Scribed by Kim, Youngshin; Yoon, Seongbeak; Yi, Juneho

Book ID: 121529065
Publisher: IEEE
Year: 2010
Weight: 611 KB
Category: Article
ISBN: 1424479924
DOI: 10.1109/ICIP.2010.5652149

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