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[IEEE 2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD) - Lille, France (2010.09.1-2010.09.3)] 2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools - On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism

✍ Scribed by Zhang, Xiao; Kerkhoff, Hans G.; Vermeulen, Bart

Book ID: 115540905
Publisher: IEEE
Year: 2010
Weight: 818 KB
Volume: 0
Category: Article
ISBN: 1424478391
DOI: 10.1109/dsd.2010.16

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