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[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - A comprehensive model for gate delay under process variation and different driving and loading conditions

✍ Scribed by Gao, Mingzhi; Zuochang Ye, ; Yao Peng, ; Yan Wang, ; Zhiping Yu,

Book ID: 121079206
Publisher: IEEE
Year: 2010
Weight: 262 KB
Category: Article
ISBN: 1424464544
DOI: 10.1109/ISQED.2010.5450543

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