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[IEEE 2010 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) - New Orleans, LA, USA (2010.01.11-2010.01.13)] 2010 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) - A new and simple measurement approach for characterizing intermodulation distortion without using a spectrum analyzer

✍ Scribed by Madan, Anuj; Thrivikraman, Tushar; Seth, Sachin; Verma, Rohan; Poh, John; Cressler, John D.

Book ID: 120068410
Publisher: IEEE
Year: 2010
Weight: 285 KB
Category: Article
ISBN: 1424454565
DOI: 10.1109/SMIC.2010.5422963

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