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[IEEE 2009 WASE International Conference on Information Engineering (ICIE) - Taiyuan, Shanxi, China (2009.07.10-2009.07.11)] 2009 WASE International Conference on Information Engineering - Automated Test Case Generation and Its Optimization for Path Testing Using Genetic Algorithm and Sampling

โœ Scribed by Mohapatra, Debasis; Bhuyan, Prachet; Mohapatra, Durga P.


Book ID
126770762
Publisher
IEEE
Year
2009
Weight
217 KB
Category
Article
ISBN
0769536794

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