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[IEEE 2009 Third International Conference on Research Challenges in Information Science (RCIS) - Fez, Morocco (2009.04.22-2009.04.24)] 2009 Third International Conference on Research Challenges in Information Science - An approach for Model-Driven test generation

โœ Scribed by Gutierrez, J.J.; Escalona, M.J.; Mejias, M.; Ramos, I.; Torres, J.


Book ID
126745922
Publisher
IEEE
Year
2009
Weight
677 KB
Category
Article
ISBN
1424428645

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