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[IEEE 2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement (SSIRI) - Shanghai, China (2009.07.8-2009.07.10)] 2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement - Analyzing Relation between Software Architecture Testing Criteria on Test Sequences

✍ Scribed by Lun, Lijun; Ding, Xuemei

Book ID: 126748398
Publisher: IEEE
Year: 2009
Weight: 476 KB
Category: Article
ISBN: 0769537588
DOI: 10.1109/SSIRI.2009.51

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