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[IEEE 2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference (NEWCAS-TAISA) - Toulouse, France (2009.06.28-2009.07.1)] 2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference - Faults diagnosis methodology for the WaferNet interconnection network

✍ Scribed by Basile-Bellavance, Yan; Blaquiere, Yves; Savaria, Yvon

Book ID: 126722447
Publisher: IEEE
Year: 2009
Weight: 397 KB
Category: Article
ISBN: 1424445736
DOI: 10.1109/NEWCAS.2009.5290412

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