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[IEEE 2009 International Workshop on Intelligent Systems and Applications - Wuhan, China (2009.05.23-2009.05.24)] 2009 International Workshop on Intelligent Systems and Applications - Effective Features Extraction Approach to Blind Steganalysis

✍ Scribed by Feng, Fan; Wang, Jiazhen; Wen, Jiafu; Bai, Xiaojia

Book ID: 121871806
Publisher: IEEE
Year: 2009
Weight: 654 KB
Category: Article
ISBN: 1424438934
DOI: 10.1109/IWISA.2009.5072843

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