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[IEEE 2009 International Workshop on Intelligent Systems and Applications - Wuhan, China (2009.05.23-2009.05.24)] 2009 International Workshop on Intelligent Systems and Applications - An Improved K-Means Algorithm Based on Multiple Feature Points

✍ Scribed by Wang, Z.; Liu, G. Q.; Guo, J. C.

Book ID: 120251728
Publisher: IEEE
Year: 2009
Weight: 255 KB
Category: Article
ISBN: 1424438934
DOI: 10.1109/IWISA.2009.5072717

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