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[IEEE 2009 International Semiconductor Conference (CAS 2009) - Sinaia, Romania (2009.10.12-2009.10.14)] 2009 International Semiconductor Conference - Defect production in silicon and germanium by low temperature irradiation

✍ Scribed by Lazanu, S.; Lazanu, I.; Lepadatu, A.; Stavarache, I.

No coin nor oath required. For personal study only.

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