[IEEE 2009 International Semiconductor Conference (CAS 2009) - Sinaia, Romania (2009.10.12-2009.10.14)] 2009 International Semiconductor Conference - Electromagnetic analysis of the experimental setup used to investigate the ratchet effect in two-dimensional electron system under microwave radiation

✍ Scribed by Takacs, A.; Medhat, D.; Aubert, H.; Portal, J.C.

• Book ID: 120973552
• Publisher: IEEE
• Year: 2009
• Weight: 890 KB
• Category: Article
• ISBN: 1424444136
• DOI: 10.1109/SMICND.2009.5336529