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[IEEE 2009 International Forum on Information Technology and Applications (IFITA) - Chengdu, China (2009.05.15-2009.05.17)] 2009 International Forum on Information Technology and Applications - Assessment of Surface Contamination of High Voltage Insulator Based on Evidence Theory

✍ Scribed by Yandong, Hou; Zhiguo, Chen; Chenglin, Wen

Book ID: 118122990
Publisher: IEEE
Year: 2009
Weight: 797 KB
Volume: 0
Category: Article
ISBN: 076953600X
DOI: 10.1109/ifita.2009.502

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