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[IEEE 2009 International Conference on Software Testing, Verification, and Validation Workshops - Denver, CO, USA (2009.04.1-2009.04.4)] 2009 International Conference on Software Testing, Verification, and Validation Workshops - Advantages of Mutation in Passive Testing: An Empirical Study

✍ Scribed by Andrés, César; Merayo, Mercedes G.; Molinero, Carlos

Book ID: 121677616
Publisher: IEEE
Year: 2009
Weight: 523 KB
Category: Article
ISBN: 1424443563
DOI: 10.1109/ICSTW.2009.33

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