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[IEEE 2009 International Conference on Research Challenges in Computer Science (ICRCCS) - Shanghai, China (2009.12.28-2009.12.29)] 2009 International Conference on Research Challenges in Computer Science - Predicting Defect-Prone Software Modules at Different Logical Levels

✍ Scribed by Huang, Peng; Zhu, Jie

Book ID: 126750660
Publisher: IEEE
Year: 2009
Weight: 259 KB
Category: Article
ISBN: 0769539270
DOI: 10.1109/ICRCCS.2009.19

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