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[IEEE 2009 International Conference on Biometrics and Kansei Engineering, ICBAKE - Cieszyn, Poland (2009.06.25-2009.06.28)] 2009 International Conference on Biometrics and Kansei Engineering - Applicability of F-value to Classification Problems with a Numerous Number of Explanatory Variables: Toward Classification Problems in Biometric and Kansei Engineering

✍ Scribed by Nagashima, Tomomasa; Wang, Xinping; Okada, Yoshifumi; Sawai, Masahiro

Book ID: 124158493
Publisher: IEEE
Year: 2009
Weight: 499 KB
Category: Article
DOI: 10.1109/ICBAKE.2009.45

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