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[IEEE 2009 IEEE/SP 15th Workshop on Statistical Signal Processing (SSP) - Cardiff, United Kingdom (2009.08.31-2009.09.3)] 2009 IEEE/SP 15th Workshop on Statistical Signal Processing - Context-based modelling of interferometric signals for the assessment of tear-film surface quality

✍ Scribed by Alonso-Caneiro, D.; Szczesna, D. H.; Iskander, D. R.; Collins, M. J.

Book ID: 126874282
Publisher: IEEE
Year: 2009
Weight: 380 KB
Category: Article
ISBN: 1424427096
DOI: 10.1109/ssp.2009.5278515

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