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[IEEE 2009 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) - San Diego, California, USA (2009.01.19-2009.01.21)] 2009 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Influences of Dummy Metal Fills on CMOS VCO

✍ Scribed by Wang, Sen; Wu, Hsien-Shun; Tzuang, Ching-Kuang C.

Book ID: 126626002
Publisher: IEEE
Year: 2009
Weight: 319 KB
Category: Article
ISBN: 142443940X
DOI: 10.1109/SMIC.2009.4770537

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