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[IEEE 2009 IEEE International Vacuum Electronics Conference (IVEC) - Rome, Italy (2009.04.28-2009.04.30)] 2009 IEEE International Vacuum Electronics Conference - RF power absorption and electric and magnetic field enhancements due to surface roughness

โœ Scribed by Zhang, Peng; Lau, Y. Y.; Gilgenbach, R. M.


Book ID
118007546
Publisher
IEEE
Year
2009
Weight
566 KB
Volume
0
Category
Article
ISBN
1424435005

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