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[IEEE 2009 IEEE International Solid-State Circuits Conference (ISSCC 2009) - San Francisco, CA (2009.02.8-2009.02.12)] 2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers - A CMOS smart temperature sensor with a batch-calibrated inaccuracy of ±0.25°C (3σ) from −70°C to 130°C

✍ Scribed by Aita, A.L.; Pertijs, M.; Makinwa, K.; Huijsing, J.H.

Book ID: 118175424
Publisher: IEEE
Year: 2009
Weight: 912 KB
Volume: 0
Category: Article
ISBN: 1424434580
DOI: 10.1109/isscc.2009.4977448

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