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[IEEE 2009 IEEE International SOC Conference (SOCC) - Belfast, Northern Ireland (2009.09.9-2009.09.11)] 2009 IEEE International SOC Conference (SOCC) - Correlating op-amp circuit noise with device flicker (1/f) noise for analog design applications

✍ Scribed by Srinivasan, P.; Marshall, A.

Book ID: 115485049
Publisher: IEEE
Year: 2009
Weight: 510 KB
Volume: 0
Category: Article
ISBN: 1424449405
DOI: 10.1109/soccon.2009.5398062

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