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[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Metal/graphene contact as a performance Killer of ultra-high mobility graphene analysis of intrinsic mobility and contact resistance

โœ Scribed by Nagashio, K.; Nishimura, T.; Kita, K.; Toriumi, A.


Book ID
115473143
Publisher
IEEE
Year
2009
Tongue
English
Weight
619 KB
Volume
0
Category
Article
ISBN
1424456398

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