๐”– Bobbio Scriptorium
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[IEEE 2009 IEEE International Conference on Robotics and Biomimetics (ROBIO) - Guilin, China (2009.12.19-2009.12.23)] 2009 IEEE International Conference on Robotics and Biomimetics (ROBIO) - Fabric defect detection based on adaptive local binary patterns

โœ Scribed by Fu, Rong; Shi, Meihong; Wei, Hongli; Chen, Huijuan


Book ID
120202417
Publisher
IEEE
Year
2009
Weight
299 KB
Category
Article
ISBN
1424447747

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