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[IEEE 2009 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) - Hong Kong, China (2009.12.8-2009.12.11)] 2009 IEEE International Conference on Industrial Engineering and Engineering Management - A meta analysis of the innovation issue: Based on the technology management field

✍ Scribed by Chang, Shann-Bin; Chang, Shu-Min

Book ID: 124083535
Publisher: IEEE
Year: 2009
Weight: 520 KB
Category: Article
ISBN: 1424448697
DOI: 10.1109/IEEM.2009.5373195

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