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[IEEE 2009 IEEE International Conference on IC Design and Technology (ICICDT) - Austin, TX, USA (2009.05.18-2009.05.20)] 2009 IEEE International Conference on IC Design and Technology - SEE characterization and mitigation in ultra-deep submicron technologies

✍ Scribed by Mavis, David G.; Eaton, Paul H.; Sibley, M. D.

Book ID: 118032648
Publisher: IEEE
Year: 2009
Weight: 821 KB
Volume: 0
Category: Article
ISBN: 1424429331
DOI: 10.1109/icicdt.2009.5166276

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