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[IEEE 2009 IEEE International Conference on Electro/Information Technology (eit '09) - Windsor, ON, Canada (2009.06.7-2009.06.9)] 2009 IEEE International Conference on Electro/Information Technology - A new image transform for a more crop-resilient NPT

✍ Scribed by Ahmed, Ayman M. T.; Day, Dwight D.

Book ID: 126750563
Publisher: IEEE
Year: 2009
Weight: 647 KB
Category: Article
ISBN: 1424433541
DOI: 10.1109/EIT.2009.5189646

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