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[IEEE 2009 IEEE International Conference on Computer Design (ICCD 2009) - Lake Tahoe, CA, USA (2009.10.4-2009.10.7)] 2009 IEEE International Conference on Computer Design - Design and test strategies for microarchitectural post-fabrication tuning

✍ Scribed by Liang, Xiaoyao; Lee, Benjamin C.; Wei, Gu-Yeon; Brooks, David

Book ID: 126637544
Publisher: IEEE
Year: 2009
Weight: 996 KB
Category: Article
ISBN: 1424450292
DOI: 10.1109/ICCD.2009.5413170

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