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[IEEE 2009 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications (CIMSA) - Hong Kong, China (2009.05.11-2009.05.13)] 2009 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications - Residual oxides detection and measurement in stainless steel production lines

✍ Scribed by Spinola, C.G.; Bonelo, J.M.; Canero, J.M.; Espejo, S.; Morilla, S.; Luque, R.M.; Martin-Vazquez, M.J.; Garcia-Vacas, F.; Galvez-Fernandez, C.; Vizoso, J.; Munoz-Perez, J.

Book ID: 126655159
Publisher: IEEE
Year: 2009
Weight: 588 KB
Category: Article
ISBN: 1424438195
DOI: 10.1109/CIMSA.2009.5069922

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