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[IEEE 2009 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Virginia Beach, VA, USA (2009.10.18-2009.10.21)] 2009 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Grounding resistance calculation using FEM and reduced scale model

✍ Scribed by Hong, Thinh Pham; Van, Quan Do; Viet, Thang Vo

Book ID: 118126532
Publisher: IEEE
Year: 2009
Weight: 235 KB
Volume: 0
Category: Article
ISBN: 1424445574
DOI: 10.1109/ceidp.2009.5377707

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