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[IEEE 2009 IEEE Asian Solid-State Circuits Conference (A-SSCC) - Taipei, Taiwan (2009.11.16-2009.11.18)] 2009 IEEE Asian Solid-State Circuits Conference - On-die parameter extraction from path-delay measurements

✍ Scribed by Takahashi, Tomoyuki; Uezono, Takumi; Shintani, Michihiro; Masu, Kazuya; Sato, Takashi

No coin nor oath required. For personal study only.

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