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[IEEE 2009 IEEE 3rd International Conference on Biometrics: Theory, Applications, and Systems (BTAS) - Washington, DC, USA (2009.09.28-2009.09.30)] 2009 IEEE 3rd International Conference on Biometrics: Theory, Applications, and Systems - Using fragile bit coincidence to improve iris recognition

โœ Scribed by Hollingsworth, Karen P.; Bowyer, Kevin W.; Flynn, Patrick J.


Book ID
126746402
Publisher
IEEE
Year
2009
Weight
325 KB
Category
Article
ISBN
1424450195

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