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[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Current — Voltage characterization of SHI irradiated silicon bipolar power transistor

✍ Scribed by Dinesh, C M; Ramani, ; Radhakrishna, M C; Madhu, K V; Jayashree, B; Khan, S A; Kanjilal, D

Book ID: 126678407
Publisher: IEEE
Year: 2009
Weight: 155 KB
Category: Article
ISBN: 1457704927
DOI: 10.1109/RADECS.2009.5994556

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