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[IEEE 2009 Design, Automation & Test in Europe Conference & Exhibition (DATE'09) - Nice (2009.04.20-2009.04.24)] 2009 Design, Automation & Test in Europe Conference & Exhibition - An overview of non-volatile memory technology and the implication for tools and architectures

✍ Scribed by Hai Li, ; Yiran Chen,

Book ID: 121015343
Publisher: IEEE
Year: 2009
Weight: 355 KB
Category: Article
ISBN: 3981080157
DOI: 10.1109/DATE.2009.5090761

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