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[IEEE 2009 Chinese Control and Decision Conference (CCDC) - Guilin, China (2009.06.17-2009.06.19)] 2009 Chinese Control and Decision Conference - Thickness measuring of multilayer conductor based on eddy current testing

โœ Scribed by Li Guohou, ; Kang Xusheng, ; Huang Pingjie, ; Chen Peihua, ; Hou Dibo, ; Zhang Guangxin, ; Zhou Zekui,


Book ID
117992321
Publisher
IEEE
Year
2009
Weight
125 KB
Volume
0
Category
Article
ISBN
1424427223

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