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[IEEE 2009 Annual Reliability and Maintainability Symposium (RAMS) - Fort Worth, TX, USA (2009.01.26-2009.01.29)] 2009 Annual Reliability and Maintainability Symposium - Step Stress Accelerated Life Testing data analysis for repairable system using proportional intensity model

✍ Scribed by Min Luo, ; Tongmin Jiang,

Book ID: 118222828
Publisher: IEEE
Year: 2009
Weight: 341 KB
Volume: 0
Category: Article
ISBN: 1424425085
DOI: 10.1109/rams.2009.4914703

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