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[IEEE 2009 Annual IEEE India Conference - Ahmedabad, India (2009.12.18-2009.12.20)] 2009 Annual IEEE India Conference - A Hybrid Test Architecture to Reduce Test Application Time in Full Scan Sequential Circuits

✍ Scribed by Ghosh, Priyankar; Mitra, Srobona; Sengupta, Indranil; Bhattacharya, Bhargab; Seth, Sharad

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