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[IEEE 2009 73rd ARFTG Microwave Measurement Conference (ARFTG) - Boston, MA, USA (2009.06.12-2009.06.12)] 2009 73rd ARFTG Microwave Measurement Conference - Improved permittivity measurement of dielectric substrates by use of the TE111 mode of a split-cylinder cavity

✍ Scribed by Janezic, Michael D.; Arz, Uwe; Begley, Shelley; Bartley, Phil


Book ID
118036231
Publisher
IEEE
Year
2009
Weight
888 KB
Volume
0
Category
Article
ISBN
1424434424

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