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[IEEE 2009 6th IEEE International Conference on Group IV Photonics (GFP) - San Francisco, CA, USA (2009.09.9-2009.09.11)] 2009 6th IEEE International Conference on Group IV Photonics - Stress-induced χ(2) in silicon — Comparison between theoretical and experimental values

✍ Scribed by Hon, Nick K.; Tsia, Kevin. K.; Solli, Daniel R.; Jalali, Bahram; Khurgin, Jacob B.

Book ID: 117995195
Publisher: IEEE
Year: 2009
Weight: 181 KB
Volume: 0
Category: Article
ISBN: 1424444020
DOI: 10.1109/group4.2009.5338380

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