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[IEEE 2009 4th International Design and Test Workshop (IDT) - Riyadh, Saudi Arabia (2009.11.15-2009.11.17)] 2009 4th International Design and Test Workshop (IDT) - Digital on-chip phase noise measurement

✍ Scribed by Ouda, Mahmoud; Hegazi, Emad; Ragai, Hany F.

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