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[IEEE 2009 4th International Design and Test Workshop (IDT) - Riyadh, Saudi Arabia (2009.11.15-2009.11.17)] 2009 4th International Design and Test Workshop (IDT) - CMOS phase frequency detector for high speed applications

✍ Scribed by Ismail, Nesreen Mahmoud Hammam; Othman, Masuri

Book ID: 111980425
Publisher: IEEE
Year: 2009
Weight: 594 KB
Volume: 0
Category: Article
ISBN: 1424457483
DOI: 10.1109/idt.2009.5404165

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