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[IEEE 2009 3rd International Conference on Signals, Circuits and Systems (SCS 2009) - Medenine, Tunisia (2009.11.6-2009.11.8)] 2009 3rd International Conference on Signals, Circuits and Systems (SCS) - Frequency- and time-domain modeling tools for efficient RF/microwave transistor characterization

✍ Scribed by Gaoua, S.; Asadi, S.; Yagoub, M.C.E.

Book ID: 118060424
Publisher: IEEE
Year: 2009
Weight: 810 KB
Volume: 0
Category: Article
ISBN: 1424443970
DOI: 10.1109/icscs.2009.5412251

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