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[IEEE 2009 20th International Zurich Symposium on Electromagnetic Compatibility - Zurich, Switzerland (2009.01.12-2009.01.16)] 2009 20th International Zurich Symposium on Electromagnetic Compatibility - Measurement of Radiated Electromagnetic field Intensity due to Micro gap discharge as low voltage ESD

✍ Scribed by Kawamata, Ken; Minegishi, Shigeki; Fujiwara, Osamu

Book ID: 126761518
Publisher: IEEE
Year: 2009
Weight: 536 KB
Category: Article
ISBN: 3952328642
DOI: 10.1109/EMCZUR.2009.4783474

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